DocumentCode
2537235
Title
Terahertz frequency-domain instrumentation for vector characterization of composite materials
Author
Yashchyshyn, Yevhen ; Derzakowski, Krzysztof ; Modelski, Józef ; Godziszewski, Konrad
Author_Institution
Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
Volume
1
fYear
2012
fDate
21-23 May 2012
Firstpage
282
Lastpage
285
Abstract
In this paper the introduction to the sub-THz technologies is presented. Many aspects of the sub-THz measurement techniques are reviewed and compared. A unique laboratory of Institute of Radioelectronics at Warsaw University of Technology equipped with the VNA with Frequency Extenders up to 500 GHz is demonstrated.
Keywords
composite materials; materials testing; microwave measurement; submillimetre wave measurement; submillimetre wave spectroscopy; terahertz spectroscopy; VNA; composite material vector characterization; subterahertz technology; terahertz frequency domain instrumentation; Antenna measurements; Frequency measurement; Permittivity; Permittivity measurement; Refractive index; Semiconductor device measurement; measurement technologies; sub-THz frequency band;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Radar and Wireless Communications (MIKON), 2012 19th International Conference on
Conference_Location
Warsaw
Print_ISBN
978-1-4577-1435-1
Type
conf
DOI
10.1109/MIKON.2012.6233515
Filename
6233515
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