DocumentCode
2537320
Title
Optimizing HPC Fault-Tolerant Environment: An Analytical Approach
Author
Jin, Hui ; Chen, Yong ; Zhu, Huaiyu ; Sun, Xian-He
Author_Institution
Dept. of Comput. Sci., Illinois Inst. of Technol., Chicago, IL, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
525
Lastpage
534
Abstract
The increasingly large ensemble size of modern High-Performance Computing (HPC) systems has drastically increased the possibility of failures. Performance under failures and its optimization become timely important issues facing the HPC community. In this study, we propose an analytical model to predict the application performance. The model characterizes the impact of coordinated checkpointing and system failures on application performance, considering all the factors including workload, the number of nodes, failure arrival rate, recovery cost, and checkpointing interval and overhead. Based on the model, we gauge three parameters, the number of compute nodes, checkpointing interval, and the number of spare nodes to conduct a comprehensive study of performance optimization under failures. Performance scalability under failures is also studied to explore the performance improvement space for different parameters. Experimental results from both synthetic and actual system failure logs confirm that the proposed model and optimization methodologies are effective and feasible.
Keywords
checkpointing; fault tolerant computing; optimisation; HPC fault-tolerant environment; checkpointing interval parameter; compute nodes parameter; high-performance computing; optimization; performance optimization; performance scalability; spare nodes parameter; Checkpointing; Computational modeling; Equations; Estimation; Maintenance engineering; Optimization; Random variables; Checkpointing; Fault Tolerance; High-Performance Computing; Performance Optimization; Scalability;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel Processing (ICPP), 2010 39th International Conference on
Conference_Location
San Diego, CA
ISSN
0190-3918
Print_ISBN
978-1-4244-7913-9
Electronic_ISBN
0190-3918
Type
conf
DOI
10.1109/ICPP.2010.80
Filename
5599253
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