• DocumentCode
    2537425
  • Title

    A 6GHz direct digital synthesizer MMIC with nonlinear DAC and wave correction ROM

  • Author

    Wu, Danyu ; Chen, Gaopeng ; Chen, Jianwu ; Liu, Xinyu ; Zhao, Lixin ; Jin, Zhi

  • Author_Institution
    Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    23-25 May 2010
  • Firstpage
    421
  • Lastpage
    424
  • Abstract
    This paper proposes a new DDS architecture combined with Nonlinear DAC and Wave-Correction-ROM (WCR) which shows both high operating speed and accuracy. Based on this architecture, a 6 GHz 8-bit DDS MMIC is designed and fabricated in 60 GHz GaAs HBT Technology. The DDS MMIC includes 8-bit pipeline accumulator, an 8×8×3 bits WCR, two combined DACs and an analog Gilbert Cell for sine-wave generation with 8-bit amplitude resolution. The DDS chip is tested in on-wafer measurement system. The measured spurious free dynamic range (SFDR) is 33.96 dBc with 2.367 GHz output under a 6 GHz maximum clock (FCW=0×65). It shows an average SFDR of 37.5 dBc and the worst case SFDR of 31.4 dBc (FCW=0×70) within the whole Nyquist band under a 5 GHz clock frequency. The whole chip occupies 2.4×2mm2 of area consuming 3.27 W of power from a single -4.6 V power supply.
  • Keywords
    III-V semiconductors; MMIC; digital-analogue conversion; direct digital synthesis; gallium arsenide; heterojunction bipolar transistors; integrated circuit design; millimetre wave bipolar transistors; read-only storage; DDS architecture; GaAs; GaAs HBT technology; MMIC; Nyquist band; amplitude resolution; analog Gilbert cell; clock frequency; direct digital synthesizer; frequency 2.367 GHz; frequency 5 GHz; frequency 6 GHz; nonlinear DAC; on-wafer measurement system; pipeline accumulator; power 3.27 W; sine-wave generation; spurious free dynamic range; voltage -4.6 V; wave correction ROM; Clocks; Dynamic range; Gallium arsenide; Heterojunction bipolar transistors; MMICs; Pipelines; Read only memory; Semiconductor device measurement; Synthesizers; System testing; digital-to-analog converter (DAC); direct digital synthesizer (DDS); emitter coupled logic (ECL); sine-weighted DAC; wave correction ROM (WCR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-6240-7
  • Type

    conf

  • DOI
    10.1109/RFIC.2010.5477279
  • Filename
    5477279