DocumentCode :
2537464
Title :
A 68-82 GHz integrated wideband linear receiver using 0.18 µm SiGe BiCMOS
Author :
Chen, Austin Ying-Kuang ; Baeyens, Yves ; Chen, Young-Kai ; Lin, Jenshan
Author_Institution :
Bell Labs., Alcatel-Lucent, Murray Hill, NJ, USA
fYear :
2010
fDate :
23-25 May 2010
Firstpage :
365
Lastpage :
368
Abstract :
This paper presents a highly integrated wideband linear receiver with on-chip active frequency doubler implemented in a low-cost 200/180 GHz fT/fmax 0.18 μm SiGe BiCMOS technology. Individual receiver circuit blocks including low-noise amplifier, passive balun, mixer, and frequency doubler have been independently characterized and optimized for wideband, NF, and linearity performance. The receiver highlights a 3 dB RF bandwidth of larger than 14 GHz from 68 GHz to at least 82 GHz. The measured peak power conversion gain is 28.1 dB with an input 1 dB compression point of -23.6 dBm, and NF of 8 dB at 77 GHz. Noise figures of 8-10 dB are achieved over the 3 dB bandwidth. The overall chip size is 1350 × 990 μm2 and the total power consumption is 413 mW. To the best of authors´ knowledge, this receiver reports the highest 3 dB RF bandwidth with excellent linearity performance among all the prior arts in SiGe HBT/BiCMOS technologies to date.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; frequency multipliers; BiCMOS technology; RF bandwidth; frequency 68 GHz to 82 GHz; gain 28.1 dB; integrated wideband linear receiver; low noise amplifier; mixer; noise figure; noise figure 8 dB to 10 dB; on-chip active frequency doubler; passive balun; peak power conversion gain; power 413 mW; power consumption; receiver circuit block; size 0.18 mum; Bandwidth; BiCMOS integrated circuits; Germanium silicon alloys; Integrated circuit technology; Linearity; Low-noise amplifiers; Noise measurement; Radio frequency; Silicon germanium; Wideband; Automotive radar; E-band; SiGe BiCMOS; microstrip line; millimeter-wave; receiver; wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-6240-7
Type :
conf
DOI :
10.1109/RFIC.2010.5477281
Filename :
5477281
Link To Document :
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