Title :
Critical distance of far field for basic radiation element
Author :
Jiang ; Ben-qing, Gao
Author_Institution :
Beijing Inst. of Technol., Beijing
Abstract :
The paper provides a new method to determine the critical distance of the far-field (FF) of a basic radiation element by calculating the relative error between approximate and exact FF values in three respects: field value in maximum radiation direction; the pattern of FF and wave impedance .The result is obtained and recommended as critical distance of the basic radiation element, which is approached engineering requirement and calculation process is reduced largely. It can be widely used in antenna analysis and EMC prediction.
Keywords :
antenna radiation patterns; electromagnetic compatibility; error analysis; EMC prediction; antenna analysis; far field distance; radiation element; relative error calculation; wave impedance; Algorithm design and analysis; Current distribution; Electromagnetic compatibility; Electromagnetic radiation; Impedance; Information science; Pattern analysis; Performance analysis; Sun; Computation Electromagnetics; EMC; critical distance; far field;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. International Symposium on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-1371-3
Electronic_ISBN :
978-1-4244-1372-0
DOI :
10.1109/ELMAGC.2007.4413509