Title :
Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications
Author :
Lin, Chun-Yu ; Chu, Li-Wei ; Ker, Ming-Dou ; Lu, Tse-Hua ; Hung, Ping-Fang ; Li, Hsiao-Chun
Author_Institution :
Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.
Keywords :
CMOS integrated circuits; MIMIC; electrostatic discharge; radiofrequency integrated circuits; CMOS process; ESD protection design; broadband RF CMOS process; electrostatic discharge protection; frequency 60 GHz; resistance 50 ohm; self-matched ESD cell library; CMOS process; CMOS technology; Circuits; Diodes; Electrostatic discharge; Inductors; Libraries; Protection; Radio frequency; Robustness; 60 GHz; Broadband; ESD cell; V-band; electrostatic discharge (ESD);
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6240-7
DOI :
10.1109/RFIC.2010.5477291