• DocumentCode
    2537880
  • Title

    Utilization of L-index in microgrid interconnected power system network

  • Author

    Dike, D.O. ; Mahajan, S.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tennessee Technol. Univ., Cookeville, TN
  • fYear
    2008
  • fDate
    20-24 July 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes the application of a novel voltage stability index computation scheme to microgrid (MG) interconnected power systems. The L-index provides an online mechanism for computing and rating the status of the interconnected system into the utility-supplied, pre-microgrid, microgrid-supplied and island operational modes for improved operation. It may also provide a triggering signal to control the point of common coupling (PCC) converter to reduce network voltage violations in situations where the MG system has the capability to inject reactive power to the grid during periods of emergency or peak loads. Simulation results obtained with IEEE 14 bus system with MG later connected to load bus twelve as a PCC to the microgrid system, showed the suitability of the developed model towards providing smooth operation under both normal and distressed conditions.
  • Keywords
    distributed power generation; power convertors; power system interconnection; power system stability; IEEE 14 bus system; L-index; interconnected power system network; microgrid; network voltage violations; point of common coupling converter; voltage stability index computation scheme; Control systems; Distributed control; Levee; Military computing; Power engineering and energy; Power supplies; Power system interconnection; Power system reliability; Power system stability; Voltage; DERs; Island Operation; Microgrid; Reactive Power Compensation; Voltage Stability Indices and Voltage Violations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1932-5517
  • Print_ISBN
    978-1-4244-1905-0
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2008.4596445
  • Filename
    4596445