DocumentCode :
2537961
Title :
Reliable low-cost fabrication and characterization methods for micromechanical disk resonators
Author :
Xie, J. ; Liu, Y.F. ; Zhao, H. ; Yang, J.L. ; Yang, F.H.
Author_Institution :
Inst. of Semicond., Chinese Acad. of Sci., Beijing, China
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
2462
Lastpage :
2465
Abstract :
A reliable low-cost method is developed to batch fabricate Micro-Electro-Mechanical Systems (MEMS) resonators with high yield. The key breakthrough in the fabrication process is one novel approach realized to effectively restrain electrochemical corrosion of polycrystalline silicon (polysilicon) electrically coupled with noble metals of MEMS devices by hydrofluoric acid (HF)-based solutions. In addition, this paper reports a novel measurement architecture based on a differential readout topology. The differential circuit proposed here can effectively suppress noise and feed-through current by common-mode rejection of the differential amplifier. This differential amplifier circuit configuration is also applied to build up a notch filter with high quality factor (24800).
Keywords :
corrosion; differential amplifiers; elemental semiconductors; microfabrication; micromechanical resonators; notch filters; reliability; silicon; HF-based solution; MEMS disk resonator; Si; common-mode rejection; differential amplifier; differential circuit; differential readout topology; electrochemical corrosion; feed-through current; hydrofluoric acid-based solution; microelectromechanical system disk resonator; microfabrication; noise suppression; notch filter; quality factor; reliable low-cost method; Corrosion; Current measurement; Differential amplifiers; Fabrication; Micromechanical devices; Resonator filters; Voltage measurement; Disk resonator; differential readout; electrochemical corrosion; notch filter; polysilicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969692
Filename :
5969692
Link To Document :
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