Title :
A self-healing 2.4GHz LNA with on-chip S11/S21 measurement/calibration for in-situ PVT compensation
Author :
Jayaraman, Karthik ; Khan, Qadeer ; Chi, Baoyong ; Beattie, William ; Wang, ZhiHua ; Chiang, Patrick
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Abstract :
This paper presents a 2.4GHz, reconfigurable RF LNA using on-chip peak detection and calibration to measure and optimize its input impedance (S11) and gain (S21) in-situ, compensating for the unpredictable effects of process, voltage and temperature (PVT) variations. Measurement results show that the calibration of the LNA across PVT corners improves the S11 by 5.1dB, S21 by 3dB, while not significantly degrading the Noise Figure (0.22dB degradation) and linearity (1.7dBm degradation).
Keywords :
low noise amplifiers; PVT compensation; frequency 2.4 GHz; input impedance; on-chip peak detection; process-voltage-and-temperature variation; reconfigurable RF LNA; Calibration; Degradation; Gain measurement; Impedance measurement; Linearity; Noise figure; Noise measurement; Radio frequency; Temperature; Voltage; LNA; PVT; on-chip calibration; peak detector;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6240-7
DOI :
10.1109/RFIC.2010.5477307
