Title :
A high quality factor varactor technology evaluation
Author :
Debroucke, Romain ; Jan, Sebastien ; Larchanché, Jean-François ; Gaquière, Christophe
Author_Institution :
STMicroelectronics, Crolles, France
Abstract :
Providing a high quality factor scalable varactor in an integrated technology is a wager. How to insure that your device will give the highest quality factor possible? In order to response this questions, we let the bases of a varactor gauge combining electrical performance and geometrical sizes. Giving a targeted capacitance, it could furnish a qualitive idea of the adequacy with technology performance. It could furnish also a indicator for comparison with other devices. As example of varactor gauge application, we present a comparison between two diode varactor devices in two BiCMOS technologies.
Keywords :
BiCMOS integrated circuits; varactors; BiCMOS technology; electrical performance; high quality factor scalable varactor; high quality factor varactor technology evaluation; integrated technology; varactor gauge application; BiCMOS integrated circuits; CMOS technology; Capacitance; Diodes; Fingers; Lithography; Millimeter wave technology; Q factor; Space technology; Varactors; BiCMOS; Diode; Figure of Merit; Quality factor; Varactor;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2010 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6240-7
DOI :
10.1109/RFIC.2010.5477308
