DocumentCode :
2538312
Title :
Analysis on the influencing factors of transformer sympathetic inrush current
Author :
Wang, Yangguang ; Yin, Xianggen ; You, Dahai ; Xu, Tianqi
Author_Institution :
Electr. Power Security & High Efficiency Lab., Huazhong Univ. of Sci. & Technol., Wuhan
fYear :
2008
fDate :
20-24 July 2008
Firstpage :
1
Lastpage :
8
Abstract :
Closing a transformer without load will lead to the emergence of sympathetic inrush current in adjacent transformer. Sympathetic inrush current always causes mal-operation of protective relay and harmonic over-voltage. Based on simplified equivalent circuit of two shunt-wound transformers, the magnetic analytical expression and rule of bias magnet attenuation are analyzed. After that, the reasons of sympathetic inrush current generation are illustrated. The effects of initial close angle, system resistance, load of transformer, shunt-wound capacitors, residual flux linkage connection in series and manner of grounding to sympathetic inrush current are then analyzed deeply. The conclusion is validated using emulate program. The conclusion of this paper is valuable in estimating the reasons of sympathetic inrush current and eliminating it.
Keywords :
earthing; equivalent circuits; overvoltage protection; power transformer protection; relay protection; bias magnet attenuation; close angle; equivalent circuit; grounding; harmonic over-voltage; protective relay mal-operation; residual flux linkage connection; shunt-wound capacitors; shunt-wound transformers; sympathetic inrush current; Attenuation; Capacitors; Circuit faults; Grounding; Inductance; Magnetic analysis; Magnetic flux; Power system protection; Substation protection; Surge protection; Connection in series; Initial close angle; Load; Manner of grounding; Residual flux; Shunt-wound capacitor; Sympathetic inrush current; System resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
Conference_Location :
Pittsburgh, PA
ISSN :
1932-5517
Print_ISBN :
978-1-4244-1905-0
Electronic_ISBN :
1932-5517
Type :
conf
DOI :
10.1109/PES.2008.4596469
Filename :
4596469
Link To Document :
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