• DocumentCode
    2538685
  • Title

    Semiconductor plasma rod attenuation dependencies of modes on the concentration of light and heavy holes

  • Author

    Bubnelis, A. ; Nickelson, L. ; Martavicius, R.

  • Author_Institution
    Dept. of Electron. Syst., Vilnius Gediminas Tech. Univ., Vilnius, Lithuania
  • Volume
    2
  • fYear
    2012
  • fDate
    21-23 May 2012
  • Firstpage
    487
  • Lastpage
    490
  • Abstract
    In this work are examined the phase and attenuation constants of open magnetoactive p-Ge rod waveguides. Our algorithm allows analyzing the very high waveguide losses. Dispersion characteristics of p-Ge with two component hole charge carriers waveguide are calculated when the ratio of heavy holes´ concentration in the material is equal to 25%, 50% and 75% of the total free carrier concentration. Dispersion characteristics of the main helicon and eight higher helicon modes are presented here. There are the degeneration and the transformation of higher hybrid modes at some heavy holes´ concentrations. The waveguide broadbandwidth can be considerably extended due to the fact that the losses of the higher modes are considerably larger in comparisons to the main mode loss at the certain heavy holes´ concentration.
  • Keywords
    carrier density; dispersion (wave); semiconductor plasma; attenuation constants; dispersion characteristics; heavy holes; light holes; p-Ge rod waveguides; phase constants; semiconductor plasma rod attenuation dependencies; total free carrier concentration; very high waveguide losses; waveguide broadbandwidth; Decision support systems; carrier concentration; d. c. magnetic field; dispersion characteristics; gyrotropic waveguide; heavy and light holes; helicon waves; losses; p-Ge; phase constan; semiconductor plasma;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Radar and Wireless Communications (MIKON), 2012 19th International Conference on
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4577-1435-1
  • Type

    conf

  • DOI
    10.1109/MIKON.2012.6233592
  • Filename
    6233592