DocumentCode :
2538814
Title :
Low power PECVD SIC delay lines for optical coherence tomography in the visible
Author :
Pandraud, G. ; Mele, L. ; Morana, B. ; Margallo-Balbás, E. ; French, P.J. ; Sarro, P.M.
Author_Institution :
DIMES-ECTM, Delft Univ. of Technol., Delft, Netherlands
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
1554
Lastpage :
1557
Abstract :
The scanning delay line is a key component of time-domain optical coherence tomography systems. It has evolved since its inception towards higher scan rates and simpler implementation. However, existing approaches still suffer from drawbacks in terms of size, cost and complexity, and are therefore not suitable for implementation using integrated optics. In this paper we report a rapid scanning delay line based on the thermo-optic effect of amorphous silicon carbide for application in the visible. The reported device attained line scan rates of 50 Hz and demonstrated a scan range of 0.4 mm. The devices use 40 times less power than similar architectures based on silicon.
Keywords :
integrated optics; light coherence; optical tomography; time-domain analysis; PECVD SIC delay lines; amorphous silicon carbide; frequency 50 Hz; integrated optics; optical coherence tomography; rapid scanning delay line; scanning delay line; size 0.4 mm; thermooptic effect; time-domain optical coherence tomography systems; Delay lines; Optical imaging; Optical interferometry; Optical reflection; Optical variables control; Optical waveguides; Silicon carbide; Optical coherence tomography; scanning delay line; silicon carbide photonics; thermo-optic effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969736
Filename :
5969736
Link To Document :
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