• DocumentCode
    2538814
  • Title

    Low power PECVD SIC delay lines for optical coherence tomography in the visible

  • Author

    Pandraud, G. ; Mele, L. ; Morana, B. ; Margallo-Balbás, E. ; French, P.J. ; Sarro, P.M.

  • Author_Institution
    DIMES-ECTM, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    1554
  • Lastpage
    1557
  • Abstract
    The scanning delay line is a key component of time-domain optical coherence tomography systems. It has evolved since its inception towards higher scan rates and simpler implementation. However, existing approaches still suffer from drawbacks in terms of size, cost and complexity, and are therefore not suitable for implementation using integrated optics. In this paper we report a rapid scanning delay line based on the thermo-optic effect of amorphous silicon carbide for application in the visible. The reported device attained line scan rates of 50 Hz and demonstrated a scan range of 0.4 mm. The devices use 40 times less power than similar architectures based on silicon.
  • Keywords
    integrated optics; light coherence; optical tomography; time-domain analysis; PECVD SIC delay lines; amorphous silicon carbide; frequency 50 Hz; integrated optics; optical coherence tomography; rapid scanning delay line; scanning delay line; size 0.4 mm; thermooptic effect; time-domain optical coherence tomography systems; Delay lines; Optical imaging; Optical interferometry; Optical reflection; Optical variables control; Optical waveguides; Silicon carbide; Optical coherence tomography; scanning delay line; silicon carbide photonics; thermo-optic effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969736
  • Filename
    5969736