DocumentCode
2539273
Title
SPR photo diode detector using transportation phenomenon of photon and electron coupling
Author
Ajiki, Yoshiharu ; Kan, Tetsuo ; Matsumoto, Kiyoshi ; Shimoyama, Isao
Author_Institution
Future Creation Lab., Olympus Corp., Tokyo, Japan
fYear
2011
fDate
5-9 June 2011
Firstpage
1915
Lastpage
1918
Abstract
We propose a Surface Plasmon Resonance (SPR) photodiode (PD) detector using transportation phenomenon of photon and electron coupling. Since SPR is usually measured by reflection intensity, a large space for measuring the intensity is required. Thus, we develop an SPR detector, which can detect an SPR condition without measuring the reflection intensity as shown in Figure 1(a). In this paper, we show that an SPR can be measured by using the sensor. And we verified the SPR transportation phenomenon of photon and electron coupling from experimental results.
Keywords
photodetectors; photodiodes; surface plasmon resonance; SPR photodiode detector; electron coupling transportation phenomenon; photon coupling transportation phenomenon; surface plasmon resonance photodiode detector; Couplings; Films; Gold; Gratings; Optical surface waves; Reflection; Surface waves; Photo diode; Photon and electron coupling; Suface Plasmon Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location
Beijing
ISSN
Pending
Print_ISBN
978-1-4577-0157-3
Type
conf
DOI
10.1109/TRANSDUCERS.2011.5969760
Filename
5969760
Link To Document