Title :
High reliability 1.3 /spl mu/m InP based uncooled lasers in non-hermetic packages
Author :
Chand, Naresh ; Osenbach, J.W. ; Evanosky, T.L. ; Comizzoli, R.B. ; Tsang, W.T.
Author_Institution :
Bell Labs., Lucent Technol., Murray Hill, NJ, USA
Abstract :
There is an increasing demand for low cost optoelectronics for fiber-in-the-loop (FITL) and cable TV (CATV) system. The availability of a reliable, nonhermetic InP based uncooled laser and associated monitor diode could provide a significant cost reduction. In non-hermetic environment, degradation of laser performance usually occurs due to lack of proper passivation of the laser facet. Moisture and contaminants can diffuse through the laser facet passivation film, which in the presence of light, heat and bias energy sources react and corrode the facets.
Keywords :
III-V semiconductors; ageing; indium compounds; laser reliability; life testing; optical testing; optical transmitters; passivation; semiconductor device packaging; semiconductor device reliability; semiconductor device testing; semiconductor lasers; 1.3 mum; InP; InP based uncooled lasers; cable TV; contaminant; cost reduction; fiber-in-the-loop; high reliability; laser facet; laser facet passivation film; laser performance; low cost optoelectronics; moisture; non-hermetic packages; reliable nonhermetic InP based uncooled laser; Availability; Cable TV; Costs; Degradation; Diodes; Fiber lasers; Indium phosphide; Monitoring; Optical fiber subscriber loops; Passivation;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.571541
