Title :
Distinguishing schizophrenic patients from healthy controls based on MRI data: A tensor linear discriminant approach
Author :
Zhang, Linchuan ; Wang, Lubin ; Shen, Hui ; Hu, Dewen
Author_Institution :
Dept. of Autom. Control, Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Recently, there are available laboratory procedures providing useful information to psychiatric diagnostic systems. In this paper, a tensor-based pattern recognition system was used to classify schizophrenic patients and healthy controls. The novel tensor approach is an extension of linear discriminant analysis (LDA). In this method, each subject´ structure MRI image was viewed as a tensor sample. After splitting samples into training and testing data, we obtained a series of projecting matrix through Tensor LDAalgorithm, and the feature matrix obtained can be used in the testing data to get the class labels. The performance of our system was tested by the leave-one-out cross-validation strategy. Experimental results showed that the sensitivity, specificity, and overall classification accuracy of our system were 86.36%, 94.44%, and 90%, respectively. Moreover, we compared the classification of Tensor LDAwith the traditional LDA. The results showed that the tensor method outperformed on this task than the traditional LDA.
Keywords :
biomedical MRI; diseases; medical diagnostic computing; patient diagnosis; tensors; MRI image data; feature matrix; healthy controls; leave-one-out cross validation strategy; linear discriminant analysis; projecting matrix; psychiatric diagnostic system; schizophrenic patients; tensor LDA algorithm; tensor LDA classification; tensor linear discriminant approach; tensor-based pattern recognition system; testing data; training data; Accuracy; Classification algorithms; Feature extraction; Magnetic resonance imaging; Pattern recognition; Tensile stress; Training; MRI; Schizophrenic; Tensor Linear Discriminant Analysis (Tensor LDA); nearest-neighbor classifier(NNC);
Conference_Titel :
Cognitive Informatics (ICCI), 2010 9th IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8041-8
DOI :
10.1109/COGINF.2010.5599683