• DocumentCode
    2539452
  • Title

    Reflectance-based TiO2 photonic crystal sensors

  • Author

    Huang, Y. ; Pandraud, G. ; Sarro, P.M.

  • Author_Institution
    DIMES, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    2682
  • Lastpage
    2685
  • Abstract
    Reflectance-based photonic crystal (PC) sensors with ALD TiO2 pillars for sensing materials with different refractive index (RI) are presented here. The relatively high RI, transparency in visible and IR region and chemical stability make TiO2 a promising material for PC sensors for applications in food or biomedical industry. An IC-compatible fabrication technique called Atomic layer deposition ARrays Defined by Etch-back technique (AARDE) is employed to form the high aspect ratios TiO2 nanopillar (240 nm radius and 800 nm pitch) arrays. The optical signals are characterized by means of reflectance other than transmittance, resulting in easier coupling and simpler process steps. High sensitivity of 739.7nm per RI unit is obtained in the 1.4 - 1.6 μm wavelength region.
  • Keywords
    photonic crystals; reflectivity; sensors; titanium compounds; IR region; TiO2; atomic layer deposition arrays defined by etch-back technique; biomedical industry; chemical stability; nanopillars; reflectance-based photonic crystal sensors; refractive index; size 1.4 mum to 1.6 mum; Optoelectronic and photonic sensors; Photonic crystals; Reflectivity; Refractive index; Silicon; ALD TiO2; Photonic crystals; reflectance; sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969771
  • Filename
    5969771