Performance of pn-junction diode lumped models for circuit simulators

An analytical approach is carried out to compare the performance of various diode lumped models for circuit simulators. Both frequency and time domain analysis are applied that justify the need of extending the basic charge-control model to more than a simple charge storage node in order to reduce the highly inaccurate prediction of the distributed diffusion and recombination processes that govern the dynamics of pn-junctions, which can effectively be finer modeled with a single zero-pole representation under certain operating conditions. This in turn allows to more precisely assess the impact of the device switching behavior in the application without compromising the required computation power