• DocumentCode
    254028
  • Title

    Multiview Shape and Reflectance from Natural Illumination

  • Author

    Oxholm, Geoffrey ; Nishino, K.

  • Author_Institution
    Dept. of Comput., Drexel Univ., Philadelphia, PA, USA
  • fYear
    2014
  • fDate
    23-28 June 2014
  • Firstpage
    2163
  • Lastpage
    2170
  • Abstract
    The world is full of objects with complex reflectances, situated in complex illumination environments. Past work on full 3D geometry recovery, however, has tried to handle this complexity by framing it into simplistic models of reflectance (Lambetian, mirrored, or diffuse plus specular) or illumination (one or more point light sources). Though there has been some recent progress in directly utilizing such complexities for recovering a single view geometry, it is not clear how such single-view methods can be extended to reconstruct the full geometry. To this end, we derive a probabilistic geometry estimation method that fully exploits the rich signal embedded in complex appearance. Though each observation provides partial and unreliable information, we show how to estimate the reflectance responsible for the diverse appearance, and unite the orientation cues embedded in each observation to reconstruct the underlying geometry. We demonstrate the effectiveness of our method on synthetic and real-world objects. The results show that our method performs accurately across a wide range of real-world environments and reflectances that lies between the extremes that have been the focus of past work.
  • Keywords
    computational geometry; estimation theory; lighting; probability; reflectivity; 3D geometry recovery; complex appearance; complex illumination environments; complex reflectances; geometry reconstruction; orientation cues; probabilistic geometry estimation method; single view geometry recovery; Cameras; Estimation; Geometry; Lighting; Probabilistic logic; Shape; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/CVPR.2014.277
  • Filename
    6909674