• DocumentCode
    2540961
  • Title

    Solid-state fault current limiters: Silicon versus silicon carbide

  • Author

    Mantooth, H. Alan ; Saadeh, Osama ; Johnson, Erik ; Balda, Juan C. ; Ang, Simon S. ; Lostetter, Alexander B. ; Schupbach, Roberto M.

  • Author_Institution
    Univ. of Arkansas, Fayetteville, AR
  • fYear
    2008
  • fDate
    20-24 July 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    As utilities face increasing fault currents in their systems as a result of increasing demand and/or deployment of new technologies, fault current limiters promise a solution that will mitigate the need for replacing existing breakers as well as being a general protective device for elements connected to the grid. This paper describes some recent advances in semiconductor-based fault current limiting technology including both the more mature silicon developments along with early developments using silicon carbide. The capabilities and limitations of these technologies are compared and contrasted. Some example scenarios of FCLs have been analyzed and are briefly described along with advanced features that semiconductor FCLs may bring to the solution space.
  • Keywords
    III-V semiconductors; fault current limiters; power semiconductor devices; silicon compounds; wide band gap semiconductors; SiC; fault currents; protective device; semiconductor-based fault current limiting technology; silicon carbide; solid-state fault current limiters; Circuit faults; Current limiters; Fault current limiters; Fault currents; Fault detection; Power semiconductor switches; Protection; Silicon carbide; Solid state circuits; Space technology; fault current limiter; power electronics; silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1932-5517
  • Print_ISBN
    978-1-4244-1905-0
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2008.4596612
  • Filename
    4596612