DocumentCode :
254136
Title :
Presentation 10. WaFeR: Model-driven test-framework for testing web UI-based applications
Author :
Iyer, G.N. ; Maddala, S. ; Kishore, S. ; Kolamala, P.S.
Author_Institution :
Progress Software Dev., India
fYear :
2014
fDate :
22-22 May 2014
Firstpage :
1
Lastpage :
3
Abstract :
With the emergence of Web 2.0 and other high-end technologies such as Cloud Computing, software applications are increasingly developed and used as Software as a Service (SaaS) applications [1]. There are several challenges associated with automated testing of such web-driven applications. Test developers often need to write several lines of automation scripts which is time consuming, needs excellent programming knowledge and results in different coding styles. Moreover, these are error prone. i.e. test developers tend to write workarounds for complex scenarios. Hence these code needs to go through several review phases to stabilize them. Further, code maintenance is difficult and time consuming for frequent changes in product design. Any change in the flow of test case requires code changes and testing of the code. Hence this is difficult to fit in Agile world. In order to overcome the above challenges, we propose a Model-driven test framework called WaFeR. Here, different use cases or application scenarios on the web application will be modeled as the test cases in the framework. Thus, we model the application scenarios (or flows) as the test cases. In addition to solving the above problems, it has many other inherent advantages. For example, the proposed model allows users to incorporate useful features as utility functions. Further, the intelligence is coded into the framework to understand logical and semantic errors in your test flow.
Keywords :
Internet; product design; program testing; user interfaces; Agile world; SaaS; WaFeR; Web 2.0; Web UI-based application testing; automation scripts; cloud computing; code maintenance; logical errors; model-driven test-framework; product design; semantic errors; software as a service; utility functions; Cloud computing; Educational institutions; Industries; Semiconductor device modeling; Software as a service; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IT Professional Conference (IT Pro), 2014
Conference_Location :
Gaithersburg, MD
Type :
conf
DOI :
10.1109/ITPRO.2014.7029298
Filename :
7029298
Link To Document :
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