• DocumentCode
    254206
  • Title

    Rectification, and Segmentation of Coplanar Repeated Patterns

  • Author

    Pritts, James ; Chum, Ondrej ; Matas, Jose

  • Author_Institution
    Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
  • fYear
    2014
  • fDate
    23-28 June 2014
  • Firstpage
    2973
  • Lastpage
    2980
  • Abstract
    This paper presents a novel and general method for the detection, rectification and segmentation of imaged coplanar repeated patterns. The only assumption made of the scene geometry is that repeated scene elements are mapped to each other by planar Euclidean transformations. The class of patterns covered is broad and includes nearly all commonly seen, planar, man-made repeated patterns. In addition, novel linear constraints are used to reduce geometric ambiguity between the rectified imaged pattern and the scene pattern. Rectification to within a similarity of the scene plane is achieved from one rotated repeat, or to within a similarity with a scale ambiguity along the axis of symmetry from one reflected repeat. A stratum of constraints is derived that gives the necessary configuration of repeats for each successive level of rectification. A generative model for the imaged pattern is inferred and used to segment the pattern with pixel accuracy. Qualitative results are shown on a broad range of image types on which state-of-the-art methods fail.
  • Keywords
    edge detection; image segmentation; coplanar repeated pattern detection; coplanar repeated pattern rectification; coplanar repeated pattern segmentation; geometric ambiguity reduction; linear constraints; pixel accuracy; planar Euclidean transformations; repeated scene elements; scene geometry; Cameras; Estimation; Feature extraction; Image segmentation; Lattices; Nonlinear distortion; Vectors; homgraphy; rectification; reflection; repeated pattern; rotation; segmentation; single-view geometry; symmetry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/CVPR.2014.380
  • Filename
    6909776