Title :
Proceedings of International Workshop on Defect and Fault Tolerance in VLSI
Abstract :
The following topics were dealt with: critical area analysis; defect sensitivity and reliability; fault tolerant architectures; fault tolerant arrays; yield projection and enhancement; fault tolerant techniques; testing techniques; self checking and coding techniques
Keywords :
VLSI; automatic testing; encoding; fault diagnosis; fault tolerant computing; integrated circuit reliability; integrated circuit testing; integrated circuit yield; logic testing; VLSI systems; coding techniques; critical area analysis; defect sensitivity; fault tolerant architectures; fault tolerant arrays; fault tolerant techniques; reliability; self checking; testing techniques; yield enhancement; yield projection;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,
Conference_Location :
Lafayette, LA, USA
Print_ISBN :
0-8186-7107-6
DOI :
10.1109/DFTVS.1995.476930
