Title :
High efficiency cross-coupled doubler with no reversion loss
Author :
Su, Feng ; Ki, Wing-Hung ; Tsui, Chi-ying
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Clear Water Bay
Abstract :
Reversion loss is analyzed in details. A 2times cross-coupled charge pump in a 0.35mu CMOS process is designed using a gate control strategy that eliminates reversion loss. It switches at 1MHz, delivers a current of 30mA, and reaches an efficiency of 95% for an input voltage of 1V to 1.6V
Keywords :
CMOS integrated circuits; losses; voltage multipliers; 0.35 micron; 1 MHz; 1.0 to 1.6 V; 30 mA; CMOS process; cross-coupled charge pump; gate control strategy; high-efficiency cross-coupled doubler; Capacitors; Charge pumps; Charge transfer; Inductors; Inverters; MOS devices; Short circuit currents; Switches; Switching converters; Voltage control;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693196
