DocumentCode :
2542667
Title :
Sensitivity analysis and evaluation of manufacturing coat of crystalline silicon PV modules
Author :
Darkazalli, G. ; Hogan, S. ; Nowlan, M.
Author_Institution :
Spire Corp., Bedford, MA, USA
fYear :
1991
fDate :
7-11 Oct 1991
Firstpage :
818
Abstract :
A 10 MW/year photovoltaic module manufacturing cost analysis was done using a financial, investment model called the investment analysis-commercial model (IACM). The analysis indicates that modules produced from either Czochralski-grown Si (Cz-SI) or cast-Si will cost close to $3.00/W. These results are in excellent agreement with costs derived from the JPL IPEG model. Several sensitivity analyses were done which indicate that further reduction in the manufacturing cost is possible through full manufacturing scale-up and improved cell performance. At these Cz or cast silicon prices a 10 MW production line will be economically viable using today´s technology and materials
Keywords :
economics; elemental semiconductors; investment; semiconductor device manufacture; sensitivity analysis; silicon; solar cell arrays; solar cells; Si; costs; economics; investment; manufacturing; performance; production line; scale-up; sensitivity analyses; solar cell arrays; Costs; Crystallization; Investments; Manufacturing; Performance analysis; Photovoltaic systems; Production; Sensitivity analysis; Silicon; Solar power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
Type :
conf
DOI :
10.1109/PVSC.1991.169322
Filename :
169322
Link To Document :
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