Title :
The Algorithm for Matching 2D Contours Based on V-System
Author :
Zhang, Caixia ; Miao, Zhihua ; Sun, Fengmei
Author_Institution :
Inst. of Image Process. & Pattern Recognition, North China Univ. of Technol., Beijing, China
Abstract :
Curve matching is one of key issues in computer vision, image analysis and pattern recognition. Based on discrete V-transform, the distance is calculated between curves using the descriptor of V-system to find the matching curves, and then the matching parameters are evaluated in this article. The new approach can find efficiently the rough location of a short extracted image curve in a long reference curve. Different from the existing approaches, it needn´t to extract feature points. Extensive tests show that it is efficient.
Keywords :
curve fitting; discrete transforms; feature extraction; image matching; 2D contour matching; V-system; computer vision; curve matching; discrete V-transform; image analysis; pattern recognition; rough location; short extracted image curve; Computer vision; Feature extraction; Image analysis; Image processing; Pattern matching; Pattern recognition; Sun; Testing;
Conference_Titel :
Pattern Recognition, 2009. CCPR 2009. Chinese Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-4199-0
DOI :
10.1109/CCPR.2009.5344090