Title :
Online Baggage Inspection with single-slice-helical CT
Author :
Wenyuan Bi ; Liang Li ; Ying Wang ; Li Zhang ; Zhiqiang Chen
Author_Institution :
China Inst. of Nucl. Inf. & Econ., Beijing, China
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
Many practical Baggage Inspections use Single-slice detector Helical CT systems (SH-CT) to balance the system cost, scanning time and recognition capability. The scanning time is usually quite short to meet the overall throughput rate, which results the projection data quite insufficient and hard to reconstruct well with ordinary methods. Usually an original reconstruction method can only reconstruct 1-2 approximate slices by projection data from one rotation. In this paper we propose the ART+3DTV reconstruction method for SH-CT systems. This method combines algebraic reconstruction technology (ART) and 3 dimensions total variation minimization (3DTV) to reconstruct the projection data scanned by SH-CT. The reconstruction quality is much better than original ART+TV result, and slices increase by 5-10 times, which brings a much better Z direction resolution. ART+3DTV required a large amount of calculation. In order to meet the limited processing time of the online application, we use latest GPU to parallelize the whole procedure. All the above work has been applied to practical baggage inspection products in the moment.
Keywords :
approximation theory; automatic optical inspection; computerised tomography; graphics processing units; image recognition; image reconstruction; image resolution; image scanners; minimisation; parallel processing; 3 dimensions total variation minimization; ART+3DTV reconstruction method; GPU; SH-CT system; algebraic reconstruction technology; baggage inspection products; online application; online baggage inspection; projection data; reconstruction quality; single-slice detector helical CT systems; 3DTV Minimization; ART; GPU Acceleration; Single-Slice Helical CT;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551050