DocumentCode :
2543608
Title :
Detection of photon-induced excitations in 235U with LaBr3:Ce scintillating detectors
Author :
Omer, M. ; Negm, H. ; Heishun Zen ; Hori, Toshikazu ; Kii, T. ; Masuda, Kohji ; Ohgaki, H. ; Hajima, Ryoichi ; Hayakawa, Takeshi ; Daito, Izuru ; Shizuma, Toshiyuki ; Fujiwara, Masamichi ; Seong Hee Park ; Kikuzawa, Nobuhiro ; Rusev, Gencho ; Tonchev, Ant
Author_Institution :
Inst. of Adv. Energy, Kyoto Univ., Uji, Japan
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
55
Lastpage :
58
Abstract :
Excitations in 235U were measured with LaBr3:Ce scintillation detectors using the nuclear resonance fluorescence (NRF) technique. A NRF experiment was performed at the High Intensity y-ray Source (HIyS) facility using quasi-monochromatic circularly or linearly polarized y-ray beams. Photons scattered at 90· relative to the incident beam were detected with two different sizes of cylindrical LaBr3:Ce detectors. Clear NRF peaks at 1733 and 1815 keY corresponding to de-excitations to the ground state and/or low-lying levels in 235U were observed within 77 minutes of beam time even under the high background due to the selfactivity of LaBr3:Ce and the radioactive decay of 214Bi nuclei existing in the 235U target. The present study shows a possibility of using LaBr3:Ce detector to perform NRF experiments, promoting many options for inspection of special nuclear materials.
Keywords :
nuclear materials safeguards; nuclei with mass number 220 or higher; photon-nucleus reactions; radioactive decay schemes; scintillation counters; 235U; HIyS facility; High Intensity gamma-ray Source facility; NRF experiment; electron volt energy 1733 keV; electron volt energy 1815 keV; ground state; linearly polarized gamma-ray beams; nuclear resonance fluorescence technique; photon induced excitation detection; quasimonochromatic circularly polarized gamma-ray beams; radioactive decay; scintillating detector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551059
Filename :
6551059
Link To Document :
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