• DocumentCode
    254365
  • Title

    Symmetry assessment by finite expansion: Application to forensic fingerprints

  • Author

    Mikaelyan, A. ; Bigun, J.

  • Author_Institution
    Sch. of Embedded & Intell. Syst., Halmstad Univ., Halmstad, Sweden
  • fYear
    2014
  • fDate
    10-12 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Common image features have too poor information for identification of forensic images of fingerprints, where only a small area of the finger is imaged and hence a small amount of key points are available. Noise, nonlinear deformation, and unknown rotation are additional issues that complicate identification of forensic fingerprints. We propose a feature extraction method which describes image information around key points: Symmetry Assessment by Finite Expansion (SAFE). The feature set has built-in quality estimates as well as a rotation invariance property. The theory is developed for continuous space, allowing compensation for features directly in the feature space when images undergo such rotation without actually rotating them. Experiments supporting that use of these features improves identification of forensic fingerprint images of the public NIST SD27 database are presented. Performance of matching orientation information in a neighborhood of core points has an EER of 24% with these features alone, without using minutiae constellations, in contrast to 36% when using minutiae alone. Rank-20 CMC is 58%, which is lower than 67% when using notably more manually collected minutiae information.
  • Keywords
    feature extraction; fingerprint identification; image forensics; image matching; EER; Rank-20 CMC; SAFE; feature extraction method; forensic fingerprint images; image information; orientation information matching; public NIST SD27 database; rotation invariance property; symmetry assessment by finite expansion; Databases; Educational institutions; Feature extraction; Forensics; Harmonic analysis; Tensile stress; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics Special Interest Group (BIOSIG), 2014 International Conference of the
  • Conference_Location
    Darmstadt
  • Print_ISBN
    978-3-88579-624-4
  • Type

    conf

  • Filename
    7029414