Emerging SEFI modes and SEE testing strategies for highly scaled NAND flash devices

Summary form only given. In addition to single event upsets during read and write operations, like many other digital devices with internal state machines and operating modes, NAND flash devices are also susceptible to single event functional interrupts (SEFI). Due to the increasing complexity of device architectures, the ability detect and characterize the SEFI events is emerging as the primary challenge in SEE testing. At JPL we have developed testing algorithms and hardware which specifically addresses this issue. We have taken SEFI and read/write upset data on devices which is presented here