Abstract :
Presents the table of contents of the proceedings.
Keywords :
Circuit testing; Clocks; Design for manufacture; Filling; Integrated circuit noise; Large scale integration; Low-noise amplifiers; Organizing; Radar; Switches;
Conference_Titel :
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
1-4244-0629-3
DOI :
10.1109/ASPDAC.2007.357782
