Title :
Hippocrates: First-Do-No-Harm Detailed Placement
Author :
Ren, Haoxing ; Pan, David Z. ; Alpert, Charles J. ; Nam, Gi-Joon ; Villarrubia, Paul
Author_Institution :
IBM Corp., Austin, TX
Abstract :
Physical synthesis optimizations and engineering change orders typically change the locations of cells, resize cells or add more cells to the design after global placement. Unfortunately, those changes usually lead to wirelength increases; thus another pass of optimizations to further improve wirelength, timing and routing congestion characteristics is required. Simple wirelength-driven detailed placement techniques could be useful in this scenario. While such techniques can help to reduce wirelength, ones without careful timing constraint considerations might degrade the timing characteristics (worst negative slack, total negative slack, etc) and/or introduce more electrical violations (exceeding maximum output load constraints and maximum input slew constraints). In this paper, we propose a new detailed placement paradigm, which use a set of pin-based timing and electrical constraints in detailed placement to prevent it from degrading timing or violating electrical constraints while reducing wire-length, thus dubbed as Hippocrates: FIRST-DO-NO-HARM optimizations. Our experimental results show great promises. By honoring these constraints, our detailed placement technique not only reduces total wirelength (TWL), but also significantly improves timing, achieving 37% better total negative slack (TNS).
Keywords :
circuit layout CAD; integrated circuit design; optimisation; Hippocrates; electrical constraints; first-do-no-harm detailed placement; pin-based timing constraint; reduced wire-length; synthesis optimizations; Constraint optimization; Degradation; Delay; Design engineering; Design optimization; Interleaved codes; Iterative methods; Routing; Simulated annealing; Timing;
Conference_Titel :
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
1-4244-0629-3
Electronic_ISBN :
1-4244-0630-7
DOI :
10.1109/ASPDAC.2007.357976