Title :
An embedded face verification system against image degradation
Author :
Lee, Sang-Woong ; Lee, Seong-Whan
Author_Institution :
Korea Univ., Seoul
Abstract :
In this paper, we propose an embedded face verification system against image degradation using a TMS320C6711 DSP chip. Our proposed system has several advantages over general systems in terms of price, size and applicability. As well as physical merits, it has an efficient approach for degraded facial images based on noise parameter estimation under real-life environments. The proposed method linearly combines image vector and noise parameters into one vector for training. When estimating noise parameters, we calculate the optimal coefficients of linear decomposition of an input image vector only. The noise parameters can be obtained from the linear composition step using these optimal coefficients. In contrast to conventional methods, we add the estimated noises to original images instead of removing them. Finally we perform a verification step with the input and synthesized image. The experimental results of this system show that the proposed method can estimate noise parameters accurately while improving the performance of photo image verification.
Keywords :
face recognition; vectors; TMS320C67II DSP chip; embedded face verification system; image degradation; image vector; noise parameter estimation; Appropriate technology; Biometrics; Degradation; Digital signal processing chips; Face recognition; Hardware; Parameter estimation; Smart cards; Vectors; Working environment noise;
Conference_Titel :
Systems, Man and Cybernetics, 2007. ISIC. IEEE International Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
978-1-4244-0990-7
Electronic_ISBN :
978-1-4244-0991-4
DOI :
10.1109/ICSMC.2007.4413904