Title :
DFM/DFY practices during physical designs for timing, signal integrity, and power
Author :
Chen, Shi-Hao ; Chu, Ke-Cheng ; Lin, Jiing-Yuan ; Tsai, Cheng-Hong
Author_Institution :
Global UniChip Corp., Hsinchu
Abstract :
We present our experience of DFM (design for manufacturability) and DFY (design for yield) considerations on physical designs at 0.13 mum and below technology nodes. The impact of some DFM approaches on timing and signal integrity are addressed. We also present our experience of yield analysis and improvement for the designs with process variation and dynamic IR drop issues.
Keywords :
design for manufacture; integrated circuit design; integrated circuit yield; manufacturing processes; timing; 0.13 micron; DFM; DFY; design for manufacturability; design for yield; dynamic IR drop; physical designs; process variation; signal integrity; timing integrity; yield analysis; Design for manufacture; Design optimization; Lithography; Manufacturing processes; Process design; Prototypes; Routing; Signal design; Timing; Wire;
Conference_Titel :
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
1-4244-0629-3
Electronic_ISBN :
1-4244-0630-7
DOI :
10.1109/ASPDAC.2007.357991
