Title :
Direct calculation of attenuation and propagation constants in superconducting microwave structures
Author :
Megahed, M.A. ; El-Ghazaly, S.M.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fDate :
June 28 1993-July 2 1993
Abstract :
The authors present a complete model which can be used for any of the transmission line structures which include high-T/sub c/ superconducting material. This model incorporates all the physical aspects of the high-T/sub c/ superconductor materials through London´s equations. It also satisfies all the electromagnetically required boundary conditions in the structure using Maxwell´s equations. The physical characteristics of the superconductor are blended with the electromagnetic model by using the phenomenological two-fluid model. The finite difference method is used to implement this model because it has a great deal of flexibility, and equations may be derived directly from Maxwell´s equations. The complex propagation constant is calculated. The losses inside the superconductor material are also evaluated. Numerical results are generated for two configurations, a superconductor microstripline filled with a lossless dielectric material with /spl epsi//sub d/=23 or with air.<>
Keywords :
Maxwell equations; finite difference methods; high-temperature superconductors; losses; microstrip lines; superconducting microwave devices; London´s equations; Maxwell´s equations; complex propagation constant; electromagnetic model; finite difference method; high-T/sub c/ superconducting material; losses; phenomenological two-fluid model; superconducting microwave structures; superconductor microstripline; Attenuation; Boundary conditions; Dielectric materials; Difference equations; Electromagnetic modeling; Finite difference methods; Maxwell equations; Propagation constant; Superconducting materials; Superconducting transmission lines;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
Conference_Location :
Ann Arbor, MI, USA
Print_ISBN :
0-7803-1246-5
DOI :
10.1109/APS.1993.385143