• DocumentCode
    2544893
  • Title

    Transient thermal analysis of lnGaN/GaN laser diodes

  • Author

    Kudsieh, Nicholas ; Khizar, Muhammad ; Shah, Attaullah ; Raja, M. Yasin Akhtar

  • Author_Institution
    Dept. of Phys. & Opt. Sci., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
  • fYear
    2010
  • fDate
    19-21 Dec. 2010
  • Firstpage
    121
  • Lastpage
    127
  • Abstract
    We have investigated the transient thermal behavior and heat distribution in a multi-quantum wells (MQWs) InGaN/GaN lasers diode for λ~445 nm based on GaN substrate. 2D thermal modeling was performed to estimate the dissipation of heat from the active region. Different thermal designs for planner and solder ball bumps packages have been studied using Al2O3, ceramic-AlN and SiC as submount materials. Comparative study of the planner to that of the solder ball bumps using thermal interfacial materials of Au metallization, AuSn solder, diamond heat spreader and Al block as heat sink. We found that planner package design using SiC as submount can be a material of choice. Furthermore, LIV characteristics show as much as 2 fold enhancement in the output power of the optimized design when operated at elevated injected current ~1000 mA.
  • Keywords
    III-V semiconductors; cooling; gallium compounds; heat sinks; indium compounds; metallisation; quantum well lasers; thermal analysis; 2D thermal modeling; Al2O3; AlN; InGaN-GaN; SiC; diamond heat spreader; heat dissipation; heat distribution; heat sink; laser diodes; metallization; multiquantum wells; solder; thermal interfacial materials; transient thermal analysis; Aluminum oxide; Gallium nitride; Heating; Materials; Silicon carbide; Thermal analysis; Transient analysis; local thermal management wurtzite band sturucture; solder bumps; submount; thermal interfacial material; trasient heat;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Capacity Optical Networks and Enabling Technologies (HONET), 2010
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-9922-9
  • Type

    conf

  • DOI
    10.1109/HONET.2010.5715758
  • Filename
    5715758