Title :
High accuracy remote temperature sensor based on BJT devices in 0.13-μm CMOS
Author :
Seong-Jin Kim ; Ng, S.S.Y. ; Wee, D. ; Yoon Hwee Leow ; Fan-Yung Ma ; Sie Boo Chiang
Author_Institution :
Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
Abstract :
This paper presents the design of a BJT-based remote temperature sensor to measure ambient temperature in different locations. The sensor chip supplies a calibrated current to the external devices, which are common off-the-shelf bipolar junction transistors - 2N3904 (NPN) and 2N3906 (PNP), and converts their base-emitter voltages to temperature using a 13-bit charge-balancing ΣΔ modulator. Dynamic element matching, correlated double sampling and system-level chopping techniques are deployed to reduce temperature errors due to non-ideal effects of CMOS readout circuitry. A prototype sensor has been fabricated using 0.13-μm CMOS process. Measurement results show that the temperature sensor inaccuracy is ±2 °C from -40 °C to 125 °C.
Keywords :
CMOS integrated circuits; bipolar transistors; choppers (circuits); measurement errors; readout electronics; sigma-delta modulation; temperature measurement; temperature sensors; 2N3904; 2N3906; BJT devices; CMOS process; CMOS readout circuit; NPN; PNP; ambient temperature measurement; base-emitter voltage conversion; charge balancing ΣΔ modulator; correlated double sampling; dynamic element matching; non-ideal effects; off-the-shelf bipolar junction transistors; prototype sensor; remote temperature sensor; size 0.13 mum; system level chopping technique; temperature errors reduction; CMOS integrated circuits; Calibration; Modulation; Photonic band gap; Temperature; Temperature measurement; Temperature sensors; Σ Δ; BJT; calibration; external biopolar junction transistor; modulator; remote sensing; temperature sensor;
Conference_Titel :
Integrated Circuits (ISIC), 2014 14th International Symposium on
Conference_Location :
Singapore
DOI :
10.1109/ISICIR.2014.7029477