DocumentCode
2545091
Title
Single Event Upset energy dependence in a buck-converter power supply design
Author
Drake, Gryphon ; De Lurgio, P. ; Gopalakrishnan, A. ; Mahadik, S. ; Mellado, B. ; Proudfoot, J. ; Reed, Robert ; Senthilkumaran, A. ; Stanek, R.
Author_Institution
Argonne Nat. Lab., Chicago, IL, USA
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
376
Lastpage
384
Abstract
We present a study of Single Event Upsets (SEU) performed on a commercial pulse-width modulator controller chip for switching power supplies. We performed tests to study the probability of an SEU occurring as a function of incident particle (hadron) energy. We discuss the performance of the circuit, and present a solution using external circuitry to effectively eliminate the effect.
Keywords
PWM power convertors; hadrons; microprocessor chips; power supply circuits; SEU; buck-converter; energy dependence; hadron; incident particle energy; pulse-width modulator controller chip; single event upset; switching power supplies;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551129
Filename
6551129
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