DocumentCode
2545242
Title
Arc flash light intensity measurement system design
Author
Wei-Jen Lee ; Zhenyuan Zhang ; Shiuan-Hau Rau ; Gammon, Tammy ; Johnson, Ben ; Beyreis, James
Author_Institution
Energy Syst. Res. Center, Univ. of Texas - Arlington, Arlington, TX, USA
fYear
2015
fDate
26-30 Jan. 2015
Firstpage
1
Lastpage
7
Abstract
Electrical arcs emit extremely high intensity light across a wide spectrum that can damage eye delicate structures, such as the cornea or the retina. Developing industry safety standards to mitigate light hazards is a critical component of arc flash safety.Accurate measurement of light intensity is the first step in understanding the level of eye protection needed. Traditionally, light measurement devices are an assembly of light detecting resistors made from cadmium sulfide (CdS) or silicon (Si) cells. However, their response times are inadequate for capturing the peak light intensity or the dynamic changes during the initial arc flash. In addition, the brightness of an arc flash is greater than the measurable light levels from traditional light measurement devices. Furthermore the light sensitivity of traditional sensors does not match the Commission Internationale de l´Éclairage (CIE) luminosity function V(λ) curve, which defines the human eye´s sensitivity to bright light as a function of wavelength under typical ambient light conditions. This paper discusses a novel light measurement technique to overcome the limitations of traditional approaches. This design is capable of measuring the light intensity of the arc flash as perceived by human eyes. These results can be used to evaluate the potential of an arc flash to harm the eyes.
Keywords
arcs (electric); eye protection; hazards; intensity measurement; occupational safety; CIE luminosity function; Commission Internationale de l´Eclairage luminosity function; arc flash light intensity measurement system; cadmium sulfide; eye delicate structure damage; eye protection; industry safety standard; light detecting resistor; light hazard mitigation; silicon cells; Arc discharges; Brightness; Optical filters; Sensitivity; Sensor phenomena and characterization; ambient light sensor; arc flash; light measurement; neutral density filter; operational amplifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Safety Workshop (ESW), 2015 IEEE IAS
Conference_Location
Louisville, KY
Print_ISBN
978-1-4799-4783-6
Type
conf
DOI
10.1109/ESW.2015.7094872
Filename
7094872
Link To Document