DocumentCode
2545317
Title
Node Mergers in the Presence of Don´t Cares
Author
Plaza, Stephen M. ; Chang, Kai-Hui ; Markov, Igor L. ; Bertacco, Valeria
Author_Institution
Dept. of EECS, Michigan Univ., Ann Arbor, MI
fYear
2007
fDate
23-26 Jan. 2007
Firstpage
414
Lastpage
419
Abstract
SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This provides significant advantages in synthesis by reducing circuit size and provides additional flexibility in technology mapping, which could be crucial in post-synthesis optimizations. Furthermore, it is also critical in verification because it can reduce the complexity of the netlist to be analyzed in equivalence checking. Most algorithms available so far for this goal do not exploit observability don´t cares (ODCs) for node merging since nodes equivalent up to ODCs do not form an equivalence relation. Although a few recently proposed solutions can exploit ODCs by overcoming this limitation, they constrain their analysis to just a few levels of surrounding logic to avoid prohibitive runtime. We develop an ODC-based node merging algorithm that performs efficient global ODC analysis (considering the entire netlist) through simulation and SAT. Our contributions which enable global ODC-based optimizations are: (1) a fast ODC-aware simulator and (2) an incremental verification strategy that limits computational complexity. In addition, our technique operates on arbitrarily mapped netlists, allowing for powerful post-synthesis optimizations. We show that global ODC analysis discovers on average 25% more (and up to 60%) node-merging opportunities than current state-of-the-art solutions based on local ODC analysis.
Keywords
equivalent circuits; logic design; ODC; SAT sweeping; computational complexity; incremental verification; node mergers; post synthesis optimizations; Algorithm design and analysis; Circuit synthesis; Computational modeling; Corporate acquisitions; Flexible printed circuits; Logic; Merging; Observability; Performance analysis; Runtime;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
1-4244-0629-3
Electronic_ISBN
1-4244-0630-7
Type
conf
DOI
10.1109/ASPDAC.2007.358021
Filename
4196067
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