• DocumentCode
    2545333
  • Title

    Development of electrical circuit model for an optical potential transformer

  • Author

    Kucuksari, Sadik ; Karady, George G.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ
  • fYear
    2008
  • fDate
    20-24 July 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Producing equivalent circuit models for potential transformers is considerably important for the relay testing and relay performance evaluations in EMTP transient studies. Magnetic transformer models have been used for many years and re-developed in time for different applications. Optical potential transformers (OPT) that produce digital and analog signals have been recently developed and have become available for power system applications. In this paper, equivalent circuit model for OPT has been developed and presented for analog output. Frequency response characteristics of OPT was obtained by using laboratory test setup. Straightforward mathematical method used the test results for developing a new OPT model. The developed circuit was validated through the frequency response test data. Results show that the developed model can be used as a legitimate OPT model.
  • Keywords
    EMTP; equivalent circuits; frequency response; potential transformers; relays; EMTP transient studies; electrical circuit model; equivalent circuit models; frequency response characteristics; magnetic transformer models; optical potential transformer; relay performance evaluations; relay testing; Circuit testing; Digital relays; EMTP; Equivalent circuits; Frequency response; Optimized production technology; Power system modeling; Power system relaying; Power system transients; Voltage transformers; Equivalent circuit; frequency response; instrument transformers; modeling; optical; protection; voltage transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting - Conversion and Delivery of Electrical Energy in the 21st Century, 2008 IEEE
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1932-5517
  • Print_ISBN
    978-1-4244-1905-0
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2008.4596852
  • Filename
    4596852