Title :
Challenges to Accuracy for the Design of Deep-Submicron RF-CMOS Circuits
Author :
Yoshitomi, Sadayuki
Author_Institution :
Microelectron. Centre, Toshiba Corp. Semicond. Co., Kawasaki
Abstract :
Two challenges for the accurate prediction of GHz CMOS analog/RF building blocks are presented. Challenging the usage of new compact MOSFET models enhances the simulation accuracy. The capability of EKV3.0 model has been studied by applying to TOSHIBA´S 130nm RF-CMOS technology. The verification facts have shown that EKV3.0 model offered excellent modeling capability of both DC and RF (small and large signal). Challenging the efficient use of electro-magnetic (EM) with one practical setup offered successful prediction of the EM effects in the chip. Enhanced study of EM co-simulation technique that links two challenges had shown the perfect prediction of the TOSHIBA´S RF-CMOS circuit (VCO).
Keywords :
CMOS analogue integrated circuits; integrated circuit design; radiofrequency integrated circuits; 130 nm; EKV3.0 model; MOSFET models; RF-CMOS analog circuits; building blocks; deep submicron; electro magnetic effects; CMOS technology; Electrons; MOSFET circuits; Predictive models; Radio frequency; Semiconductor device modeling; Silicides; Silicon; Voltage; Voltage-controlled oscillators;
Conference_Titel :
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
1-4244-0629-3
Electronic_ISBN :
1-4244-0630-7
DOI :
10.1109/ASPDAC.2007.358025