Title :
An on-chip jitter measurement circuit with sub-picosecond resolution
Author :
Jenkins, Keith A. ; Jose, Anup P. ; Heidel, David F.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A circuit for accurate on-chip measurement of timing jitter is demonstrated. Measurements with the circuit show excellent reproduction of corresponding off-chip measurements made with an oscilloscope, and resolution measurements show the jitter resolution of the circuit to be better than 0.4 ps rms. The circuit is very compact, occupying 3200 μm2 in a 0.13μm, 1.2V, CMOS technology, and operates up to 2.5 GHz in this technology.
Keywords :
CMOS integrated circuits; integrated circuit measurement; integrated circuit testing; timing jitter; 0.13 micron; 1.2 V; CMOS technology; jitter measurement circuit; jitter resolution; on-chip measurement; resolution measurements; timing jitter; CMOS technology; Circuit testing; Clocks; Counting circuits; Delay; Latches; Oscilloscopes; Semiconductor device measurement; Signal resolution; Timing jitter;
Conference_Titel :
Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
Print_ISBN :
0-7803-9205-1
DOI :
10.1109/ESSCIR.2005.1541583
