Title :
Unit resistor characterization for matching-critical circuit design
Author :
Lin, Yu ; Geiger, Randall
Author_Institution :
Dept. of Electr. Eng., Iowa State Univ., Ames, IA
Abstract :
Unit resistors are widely used in matching-critical applications. In good designs, matching performance is dominantly determined by the characteristics of the unit resistor. In this paper, a strategy for statistically characterizing the performance of unit resistors that combines the effects of contact resistance, contact size variations, sheet resistance and edge variations is introduced
Keywords :
contact resistance; equivalent circuits; impedance matching; network synthesis; resistors; contact resistance; contact size variation; edge variations; matching-critical applications; matching-critical circuit design; sheet resistance; statistically characterization; unit resistor characterization; Circuit synthesis; Conductivity; Contact resistance; Electric resistance; Equations; Immune system; Personal communication networks; Resistors; Shape; Transistors;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693370
