• DocumentCode
    2545745
  • Title

    The performance of recently developed high voltage high current power transistors

  • Author

    Lamm, J.L. ; Konnan, Y.A.

  • Author_Institution
    Solitron Devices, Inc., Riviera Beach, FL, USA
  • fYear
    1972
  • fDate
    22-23 May 1972
  • Firstpage
    160
  • Lastpage
    163
  • Abstract
    A new generation of planar high voltage, high current transistors has evolved which makes use of new high current density techniques. The resulting transistors have already been made with Collector to Base breakdown voltages of over 1500 volts and Collector to Emitter sustaining (base terminal open circuit) voltages of over 1000 volts. The high current density techniques have permitted current capabilities of 60 amperes, combined with sustaining voltages over 400volts on a single chip transistor.
  • Keywords
    power transistors; collector to base breakdown voltages; collector to emitter sustaining voltages; high current density techniques; high voltage high current power transistors; Conductivity; Current measurement; Doping; Electric breakdown; Epitaxial growth; Integrated circuits; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1972 IEEE
  • Conference_Location
    Atlantic City
  • ISSN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PPESC.1972.7094900
  • Filename
    7094900