DocumentCode
2545745
Title
The performance of recently developed high voltage high current power transistors
Author
Lamm, J.L. ; Konnan, Y.A.
Author_Institution
Solitron Devices, Inc., Riviera Beach, FL, USA
fYear
1972
fDate
22-23 May 1972
Firstpage
160
Lastpage
163
Abstract
A new generation of planar high voltage, high current transistors has evolved which makes use of new high current density techniques. The resulting transistors have already been made with Collector to Base breakdown voltages of over 1500 volts and Collector to Emitter sustaining (base terminal open circuit) voltages of over 1000 volts. The high current density techniques have permitted current capabilities of 60 amperes, combined with sustaining voltages over 400volts on a single chip transistor.
Keywords
power transistors; collector to base breakdown voltages; collector to emitter sustaining voltages; high current density techniques; high voltage high current power transistors; Conductivity; Current measurement; Doping; Electric breakdown; Epitaxial growth; Integrated circuits; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1972 IEEE
Conference_Location
Atlantic City
ISSN
0275-9306
Type
conf
DOI
10.1109/PPESC.1972.7094900
Filename
7094900
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