• DocumentCode
    2545760
  • Title

    Fast Electrical Correction Using Resizing and Buffering

  • Author

    Karandikar, Shrirang K. ; Alpert, Charles J. ; Yildiz, Mehmet C. ; Villarrubia, Paul ; Quay, Steve ; Mahmud, Tuhin

  • Author_Institution
    Res. Lab., IBM, Austin, TX
  • fYear
    2007
  • fDate
    23-26 Jan. 2007
  • Firstpage
    553
  • Lastpage
    558
  • Abstract
    Current design methodologies are geared towards meeting different design criteria, such as delay, area or power. However, in order to correctly identify the critical parts of a circuit for optimization, the circuit has to be electrically clean - i.e., slews on each pin have to be within certain limits, a gate cannot drive more than a certain amount of capacitance, etc. Thus far, this requirement has largely been ignored in the literature. Instead, existing methods which optimize delay are used to fix electrical violations. This leads to solutions that are unnecessarily expensive, and still leave violations that remain unfixed. There is therefore a need for an area-efficient strategy that targets the electrical state of a circuit and fixes all violations quickly. This paper explicitly defines "electrical violations" and presents a flexible approach (called EVE, the electrical violation eliminator) for fixing these. Experimental results validate our approach.
  • Keywords
    integrated circuit design; logic design; electrical state; electrical violation eliminator; fast electrical correction; Capacitance; Circuits; Delay; Design optimization; Electronic design automation and methodology; Energy consumption; Laboratories; Optimization methods; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    1-4244-0629-3
  • Electronic_ISBN
    1-4244-0630-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2007.358044
  • Filename
    4196090