DocumentCode
2545892
Title
Two-dimensional neighborhood preserving embedding for face recognition
Author
Du, Haishun ; Wang, Sheng ; Zhao, Jianjun ; Xu, Na
Author_Institution
Inst. of Image Process. & Pattern Recognition, Henan Univ., Kaifeng, China
fYear
2010
fDate
16-18 April 2010
Firstpage
500
Lastpage
504
Abstract
Neighborhood Preserving Embedding (NPE) is a subspace learning algorithm, which has the ability of preserving local neighborhood structure on the data manifold. Though NPE has been applied in many domains of pattern recognition, it is a vector-based method and will be encountered the small size sample (SSS) problem when it is directly applied to face recognition. To address this problem, the popular method is to use PCA prior to performing NPE, but the pre-processing procedure using PCA could result in the loss of some important discriminatory information. In this paper, a novel method called two-dimensional neighborhood preserving embedding (2DNPE) is proposed to extract the features for face recognition. Extensive experiments are performed to test and evaluate the new method using ORL and Yale face database. The experimental results indicate that the 2DNPE method has better face recognition performance and more effective.
Keywords
face recognition; feature extraction; learning (artificial intelligence); principal component analysis; vectors; 2D neighborhood preserving embedding; Yale face database; data manifold; face recognition; feature extraction; pattern recognition; principal component analysis; small size sample problem; subspace learning algorithm; vector based method; Face recognition; Feature extraction; Image databases; Image reconstruction; Learning systems; Linear discriminant analysis; Pattern recognition; Principal component analysis; Spatial databases; Vectors; face recognition; neighborhood preserving embedding(NPE); subspace learning; two-dimensional neighborhood preserving embedding(2DNPE);
fLanguage
English
Publisher
ieee
Conference_Titel
Information Management and Engineering (ICIME), 2010 The 2nd IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-5263-7
Electronic_ISBN
978-1-4244-5265-1
Type
conf
DOI
10.1109/ICIME.2010.5477710
Filename
5477710
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