Title :
Encapsulation and diagnosis with fault dictionaries
Author :
Simpson, William R. ; Sheppard, John W.
Author_Institution :
Inst. for Defense Anal., Alexandria, VA, USA
Abstract :
To date, test and diagnosis has been domain knowledge driven. However, as system complexity grows and we strive to develop reusable components, the concept of encapsulation becomes increasingly important. Encapsulation embodies the concepts of separation and partitioning. In this paper we deal with encapsulation by illustration of the fault dictionary approach to digital electronics. We then extend the concept of encapsulation to the system test approach as well as the development of maintenance systems. Finally we develop the concept that encapsulation is a key element in achieving general standardization open system architectures
Keywords :
automatic testing; data encapsulation; fault diagnosis; knowledge based systems; logic testing; military computing; open systems; standardisation; complexity; diagnosis; digital electronics; encapsulation; fault dictionaries; open system architectures; partitioning; reusable components; separation; standardization; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Digital circuits; Digital simulation; Electronic equipment testing; Encapsulation; Fault diagnosis; System testing;
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3379-9
DOI :
10.1109/AUTEST.1996.547772