• DocumentCode
    2546096
  • Title

    Design methodology for hardware-efficient fault-tolerant nanoscale circuits

  • Author

    Chen, Jie ; Li, Hua

  • Author_Institution
    Div. of Eng., Brown Univ., Providence, RI
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Abstract
    In this paper, we propose to use ensemble dependent matrices for describing combinatorial nanoscale circuits. We then apply various signal-processing techniques, including eigen analysis, and the use of mutual information, for hardware-efficient fault-tolerant nanoscale design at the system level. We find that the condition of an ensemble matrix product determines the circuit´s fault-tolerant capability. If the product matrix is ill-conditioned, the combinatorial circuit is more error-prone. The knowledge gained from this project can be used eventually to develop computer-aided design tools for optimal nanoscale circuit and system design
  • Keywords
    circuit reliability; combinational circuits; fault tolerance; logic design; nanoelectronics; combinatorial nanoscale circuits; computer-aided design tools; eigen analysis; ensemble dependent matrices; fault-tolerant nanoscale circuits; mutual information; signal-processing; system design; Circuits; Computer errors; Design automation; Design methodology; Fault tolerance; Fault tolerant systems; Information analysis; Mutual information; Signal analysis; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Conference_Location
    Island of Kos
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1693386
  • Filename
    1693386