Title :
Design methodology for hardware-efficient fault-tolerant nanoscale circuits
Author :
Chen, Jie ; Li, Hua
Author_Institution :
Div. of Eng., Brown Univ., Providence, RI
Abstract :
In this paper, we propose to use ensemble dependent matrices for describing combinatorial nanoscale circuits. We then apply various signal-processing techniques, including eigen analysis, and the use of mutual information, for hardware-efficient fault-tolerant nanoscale design at the system level. We find that the condition of an ensemble matrix product determines the circuit´s fault-tolerant capability. If the product matrix is ill-conditioned, the combinatorial circuit is more error-prone. The knowledge gained from this project can be used eventually to develop computer-aided design tools for optimal nanoscale circuit and system design
Keywords :
circuit reliability; combinational circuits; fault tolerance; logic design; nanoelectronics; combinatorial nanoscale circuits; computer-aided design tools; eigen analysis; ensemble dependent matrices; fault-tolerant nanoscale circuits; mutual information; signal-processing; system design; Circuits; Computer errors; Design automation; Design methodology; Fault tolerance; Fault tolerant systems; Information analysis; Mutual information; Signal analysis; Signal design;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693386