DocumentCode :
2546143
Title :
The DSSC pixel readout ASIC with amplitude digitization and local storage for DEPFET sensor matrices at the European XFEL
Author :
Erdinger, F. ; Bombelli, L. ; Comotti, D. ; Facchinetti, S. ; Fischer, P. ; Hansen, Karsten ; Kalavakuru, Pradeep ; Kirchgessner, Manfred ; Manghisoni, Massimo ; Porro, M. ; Quartieri, Emanuele ; Reckleben, Christian ; Soldat, Jan ; Szymanski, Janusz
Author_Institution :
Inst. for Comput. Eng., Univ. of Heidelberg, Mannheim, Germany
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
591
Lastpage :
596
Abstract :
The DSSC (DEPFET Sensor with Signal Compression) consortium develops a IMPixel detector for low energy X-rays at the European XFEL. The XFEL will produce 10 bursts per second, each containing 2880 X-ray pulses with a repetition rate of 4.5 MHz. X-ray photons of 0.5 - 6 keV are absorbed in hexagonal DEPFET pixels of 229 × 204 μm2 pitch with a nonlinear characteristic to achieve a high dynamic range. The sensors will be bump bonded to readout ASICs of 64 × 64 pixels. Each pixel contains a filter with trapezoidal weighting function, a single slope ADC of 8-9 Bit resolution and a digital memory to store 640 events. A veto mechanism allows to discard uninteresting events. The digital hit data is read out serially during the ≈100 ms long burst gaps. Prototype matrix chips of 8 × 8 pixels with the full functionality have been produced and characterized electronically and with DEPFET sensors. The architecture and the design of the 8 × 8 ASIC, measured results and an outlook to the large 64 × 64 pixel chip will be presented.
Keywords :
application specific integrated circuits; free electron lasers; nuclear electronics; readout electronics; semiconductor counters; DEPFET sensor matrices; DSSC consortium; DSSC pixel readout ASIC; European XFEL; X-ray photons; X-ray pulses; amplitude digitization; digital memory; electron volt energy 0.5 keV to 6 keV; frequency 4.5 MHz; hexagonal DEPFET pixels; local storage; low energy X-rays; prototype matrix chips; signal compression; single slope ADC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551176
Filename :
6551176
Link To Document :
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